Environmental Test Chambers | Temperature Characterization | Small Environmental Test Chambers | Temperature Cycling Test | Environmental Stress Testing | Thermal Stress Testing | MPI

Temperature Forcing System & Small Environmental Test Chambers


ThermalAir TA-5000 Series of Temperature Test Systems

The MPI Thermo Cycling Test Systems provide Precise Thermal Forcing and Temperature Testing Capabilities for Electronic and Non-Electronic Components.

Small Environmental Test Chambers

TA-5000A ThermalAir 

Thermal Cycling Test System

The ThermalAir TA-5000 is a compact and portable, bench top environmental heating and cooling system for performing thermal cycling tests.

index-thermalrange (1)

Our Thermal Cycling Test Systems eliminate the need for large ovens or walk-in Environmental Test Chambers allowing you to perform accurate temperature testing right where you need it – at the test bench, in the laboratory, or on the production floor.

Download the Datasheets

The ThermalAir line of temperature testing systems are a  series of flexible high capacity thermal air stream systems used for performing accurate thermo cycler tests, fast thermal shock, and device temperature characterization of components, semiconductor ICs, hybrids, modules, PCBs, and other electronic and non-electronic assemblies with an air stream of dry hot and cold at precise temperatures from -90°C to +225°C in just seconds.

Application & Industry Segments

Environmental Test Chambers | Temperature Test Chambers | Environmental Stress Testing | Thermal Stress Testing | Thermo Cycler | Thermal Stream | MPI

Temperature Stress Testing


ThermalAir TA-5000 temperature stress testing equipment and environmental test chambers provide accurate thermal cycling of any electronic, electromechanical, and non-electronic components at wide temperature ranges to meet your application requirements.

Industrial electronic manufacturers offer features with reliable operating performance specifications and they need to guarantee their products under the most demanding environmental conditions.

The ThermalAir TA-5000 brings localized temperature right to the test point. Our ThermalAir systems provide maximum flexibility and mobility for use at the test station, in the engineering lab, and the on the production test floor.

Temperature Cycling Test Enclosure

Thermal Air Forcing System


MPI ThermalAir temperature forcing systems provide a direct thermal stream of clean dry hot and cold air directly to the part that needs to be thermal tested. In the lab or on the production floor, ThermalAir Series provide unparalleled thermal stress testing  capabilities for scientist and engineers.


  • Super Quiet DC Inverter Chiller Technology
  • -55°C to +125°C / +125°C to -55°C in 10 sec
  • Eco-Friendly – Up to 50% Energy Savings
  • Two built-in Touch Screen displays
  • Control Temperature at the Test Site
  • Standard Mode & Economy Mode
  • Up to 20 SCFM Output Air Flow

Temperature characterization of thermal packages is crucial for the reliability and performance of IC applications. To maintain the device’s junction temperature below the maximum allowed, adequate heat flow from the semiconductor IC through the package to ambient temperatures is critical. Thermal Management, Thermal Cycling, and Thermal Analysis and testing helps provide accurate package and system thermal predictions.

ThermalAir Series of temperature testing systems and environmental test chambers play a critical role in determining product reliability by providing flexible thermal stress testing systems that provide a temperature controlled hot and cold air stream directly to the parts and electronics requiring environmental stress testing.

TA5000 Series are 50% more energy efficient.

Download the Datasheets

Tempertaure Cycling System
Thermal Cycling Test
Small Temperature Test Chamber
Thermal Cycling Test Enclosure
Thermal Test Enclosure

MPI | Environmental Test Chambers | Temperature Test Chambers | Environmental Stress Testing | Thermal Stress Testing | Thermo Cycler | Thermal Stream

 Temperature Testing Solutions for the Future


Thermal Testing Systems


error: Content is protected !!