Halt Test Chamber | Halt Test Chambers | Hass Test Chambers | Highly Accelerated Life Tests | Halt/Hass Chamber | High Temperature Chambers | Low Temperature Chambers

Halt Test Chambers

ThermalAir Series of Halt Temperature Test Chambers

The ThermalAir TA5000 is a compact, portable bench top environmental heating and cooling HALT Test Chamber system.

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Halt Test Chambers

Highly Accelerated Life Test Chambers

Temperature Testing Range
Instead of taking your parts that need low temperature testing or high temperature testing, to an oven or environmental test chamber, our temperature HALT chamber test system allows you to perform your thermal test temperature profiling right where you need it – at your test bench, on your production floor or in your test laboratory.

The ThermalAir HALT/HASS chambers systems are a  series of high capacity thermal air stream systems that are used for thermal testing, high temperature testing and device temperature characterization of components, hybrids, modules, PCBs, and other electronic and non-electronic assemblies at precise temperature ranges from -90°C to +225°C

High Temperature Test Chamber

Whether it’s environmental temperature testing, thermal profiling, temperature cycling, thermal shock, or test conditioning, ThermalAir Temperature Test Equipment can help with your temperature testing requirements

High Temperature Test Chambers

Low Temperature Test Chambers

The ThermalAir TA-5000 products with a wide range of temperature testing capabilitiesThe ThermalAir TA-5000 products with a wide range of temperature testing capabilities. Bench top -40°C to +80°C applications to temperature cycling -100°C to +300°C environmental temperature test. The TA-5000 is used for temperature testing in engineering product development test labs and production test floors for semiconductor IC devices and all kinds of electronic – non-electronic components and other parts and assemblies.. Bench top -40°C to +80°C applications to temperature cycling -100°C to +300°C environmental temperature test. The TA-5000 is used for temperature testing in engineering product development test labs and production test floors for semiconductor IC devices and all kinds of electronic – non-electronic components and other parts and assemblies.

HALT HASS Test Chambers
TA-5000A with Hood

High Temperature Test Chambers
TA-5000A with Clamshell & Flex Hose

Halt Test Chamber | Halt Test Chambers | Hass Test Chambers | Highly Accelerated Life Testing | Halt/Hass Chamber | High Temperature Chambers | Low Temperature Chambers

ThermalAir Temperature HALT/HASS Chambers

MPI Thermal Systems provide an array of temperature testing capabilities to accommodate a variety of products requiring extreme environmental temperature testing. Bench top -40°C to +80°C applications to temperature cycling -100°C to +300°C environmental temperature test. Our thermal forcing systems are use for failure analysis in semiconductor IC devices and all types of electronic – non-electronic components and other parts and assemblies.

Highly Accelerated Life Test Chamber
TA-5000A Highly Accelerated
Temperature Testing System

Temperature Forcing System & Temperature Test Enclosure
TA-5000A HALT Test System
with Hood

 Halt Test Chamber
TA-5000A Halt Test Chamber
with Flex Hose

HALT HASS Test Chamber
TA-5000B HALT HASS Test Chamber
with Flex Hose

Specification Features & Benefits

  • Ultra Cold Temperatures maintained at 50&60Hz
  • Dual Touch Screens Front Panel & Thermal Head
  • Plug-in anywhere from 200~250VAC, 1Ø
  • ECO Smart DC system for up to 50% energy saving
  • No voltage configuration to use at different locations
  • Versatile Boom & Stand – Extended reach standard
  • SSD for thermal file management and data logging
  • Control Heated dry air purge for frost free operation
  • One touch Temp Cycle, Ramp, Soak and Dwell
  • Ultra low audible noise for quiet engineering lab use

Environmental Temperature Testing Chamber - Temperature Test Systems and Thermal Test System

System Performance

 

  • Airflow: High capacity 10 l/s (20 scfm) continuous airflow optimizes temperature transition rate and throughput.
  • Typical Temperature transition rate:
-55° to +125°C: approximately 10 seconds
+125° to -55°C: approximately 10 seconds
  • Temperature Control: Environment Air or External DUT sensing directly at the DUT case to ±1.0°C
  • Temperature control Sensor Ports: Type T or Type K thermocouple, and 100 ohm RTD
  • Temperature set, display and resolution: ±0.1°C
  • Temperature Accuracy: 1.0°C ( calibrated to NIST standard)
  • Remote interface ports: Four: IEEE-488, RS232C, SOT/EOT/SFF, And Ethernet, 4 USB-Type A, 1 USB-Type B, VGA, LAN, PLUS Auto Start Test & End of Test for automatic temperature cycling Hot-Cold-Amb. All this makes for simple control and service ability.

 

 HALT/HASS Test Chambers

MPI Thermal Test Chambers meet the demand for localized environmental temperature testing.

The ThermalAir temperature test equipment is used for thermal test of semiconductor,  automotive sensors,fiber optic components, microwave, hybrids, MCMs, PCBs or any type of electronic and non-electronic parts. Our temp cycle systems connect to your test setup to bring temperature test capabilities directly to your bench top or test station.

HALT Environmental Chamber
Environmental Chamber Clamshell Model

HALT HASS Environmental Chamber
Environmental Chamber Hood Model

With quality construction, this innovative technology allows you to perform temperature simulation tests in situ, at a specific location, at your tester station, test bench, or directly on the unit under test.

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